Prof. Yusuf Leblebici received the B.Sc. and
M.Sc. degrees in electrical engineering from
Istanbul Technical University, Istanbul,
Turkey, in 1984 and 1986, respectively, and
the Ph.D. degree in electrical and computer
engineering from the University of Illinois,
Urbana-Champaign (UIUC), in 1990.
Between 1991 and 2001, he worked as a
faculty member at UIUC, at Istanbul Technical University, and at
Worcester Polytechnic Institute (WPI). In 2000-2001, he also
served as the Microelectronics Program Coordinator at Sabanci
University. Since 2002, he has been a Chair Professor at the
Swiss Federal Institute of Technology in Lausanne (EPFL), and
director of Microelectronic Systems Laboratory. His research
interests include design of high-speed CMOS digital and mixedsignal
integrated circuits, computer-aided design of VLSI
systems, intelligent sensor interfaces, modeling and simulation
of semiconductor devices, and VLSI reliability analysis. He is the
coauthor of four textbooks, namely, Hot-Carrier Reliability of
MOS VLSI Circuits (Kluwer Academic Publishers, 1993), CMOS
Digital Integrated Circuits: Analysis and Design (McGraw Hill,
1st Edition 1996, 2nd Edition 1998, 3rd Edition 2002), CMOS
Multichannel Single-Chip Receivers for Multi-Gigabit Optical
Data Communications (Springer, 2007) and Fundamentals of
High Frequency CMOS Analog Integrated Circuits (Cambridge
University Press, 2009), as well as more than 200 articles
published in various journals and conferences.
Dr. Leblebici has served as an Associate Editor of IEEE
Transactions on Circuits and Systems II and IEEE Transactions
on VLSI Systems. He has also served as the general co-Chair of
the 2006 European Solid-State Circuits Conference, and the
2006 European Solid State Device Research Conference
(ESSCIRC/ESSDERC). He has been elected as Distinguished
Lecturer of the IEEE Circuits and Systems Society for 2010-
2011 and is an IEEE Fellow.
